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  Bulk and surface electronic properties of SmB6: A hard x-ray photoelectron spectroscopy study

Utsumi, Y., Kasinathan, D., Ko, K.-T., Agrestini, S., Haverkort, M. W., Wirth, S., et al. (2017). Bulk and surface electronic properties of SmB6: A hard x-ray photoelectron spectroscopy study. Physical Review B, 96(15): 155130, pp. 1-10. doi:10.1103/PhysRevB.96.155130.

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Utsumi, Y.1, Autor           
Kasinathan, D.1, Autor           
Ko, K.-T.2, Autor           
Agrestini, S.3, Autor           
Haverkort, M. W.4, Autor           
Wirth, S.5, Autor           
Wu, Y-H.6, Autor
Tsuei, K-D.6, Autor
Kim, D-J.6, Autor
Fisk, Z.6, Autor
Tanaka, A.6, Autor
Thalmeier, P.7, Autor           
Tjeng, L. H.8, Autor           
Affiliations:
1Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863445              
2Kyung-Tae Ko, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863451              
3Stefano Agrestini, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863459              
4Maurits Haverkort, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863455              
5Steffen Wirth, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863460              
6external, ou_persistent22              
7Peter Thalmeier, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863457              
8Liu Hao Tjeng, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863452              

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 Zusammenfassung: We have carried out bulk-sensitive hard x-ray photoelectron spectroscopy measurements on in situ cleaved and ex situ polished SmB6 single crystals. Using the multiplet structure in the Sm 3d core level spectra, we determined reliably that the valence of Sm in bulk SmB6 is close to 2.55 at similar to 5 K. Temperature dependent measurements revealed that the Sm valence gradually increases to 2.64 at 300 K. From a detailed line shape analysis we can clearly observe that not only the J = 0 but also the J = 1 state of the Sm 4f(6) configuration becomes occupied at elevated temperatures. Making use of the polarization dependence, we were able to identify and extract the Sm 4f spectral weight of the bulk material. Finally, we revealed that the oxidized or chemically damaged surface region of the ex situ polished SmB6 single crystal is surprisingly thin, about 1 nm only.

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Sprache(n): eng - English
 Datum: 2017-10-182017-10-18
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: ISI: 000413167700002
DOI: 10.1103/PhysRevB.96.155130
 Art des Abschluß: -

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Titel: Physical Review B
  Kurztitel : Phys. Rev. B
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: Woodbury, NY : American Physical Society
Seiten: - Band / Heft: 96 (15) Artikelnummer: 155130 Start- / Endseite: 1 - 10 Identifikator: ISSN: 1098-0121
CoNE: https://pure.mpg.de/cone/journals/resource/954925225008