Tip preparation for usage in an ultra-low temperature UHV scanning tunneling 
microscope

Ernst, S.; Wirth, S.; Rams, M.; Dolocan, V.; Steglich, F.

doi:10.1016/j.stam.2007.05.008

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Tip preparation for usage in an ultra-low temperature UHV scanning tunneling microscope

Ernst, S., Wirth, S., Rams, M., Dolocan, V., & Steglich, F. (2007). Tip preparation for usage in an ultra-low temperature UHV scanning tunneling microscope. Science and Technology of Advanced Materials, 8, 347-351. doi:10.1016/j.stam.2007.05.008.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-293B-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-F124-B

Genre: Journal Article

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Creators:
Ernst, S.¹, Author
Wirth, S.², Author
Rams, M.¹, Author
Dolocan, V.¹, Author
Steglich, F.³, Author

Affiliations:
1Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404
2Steffen Wirth, Physics of Correlated Matter, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863460
3Frank Steglich, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863467

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Language(s): eng - English

Dates: Date issued: 2007-07

Publication Status: Issued

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Identifiers: eDoc: 332711
ISI: 000250154900003
DOI: 10.1016/j.stam.2007.05.008

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Title: Science and Technology of Advanced Materials

Source Genre: Journal

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Pages: - Volume / Issue: 8 Sequence Number: - Start / End Page: 347 - 351 Identifier: ISSN: 1468-6996