Detection of trace impurities and other defects in functional nanomaterials

Lim, Joohyun; Kim, Se-Ho; Sahu, Rajib; Aymerich Armengol, Raquel; Kasian, Olga; Choi, Pyuck-Pa; Stephenson, Leigh; Gault, Baptiste; Scheu, Christina

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Detection of trace impurities and other defects in functional nanomaterials

Lim, J., Kim, S.-H., Sahu, R., Aymerich Armengol, R., Kasian, O., Choi, P.-P., et al. (2019). Detection of trace impurities and other defects in functional nanomaterials. Talk presented at International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019. Düsseldorf, Germany. 2019-10-27 - 2019-10-30.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0005-469D-C Versions-Permalink: https://hdl.handle.net/21.11116/0000-0005-46B2-3

Genre: Vortrag

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Urheber:
Lim, Joohyun¹, Autor
Kim, Se-Ho², Autor
Sahu, Rajib¹, Autor
Aymerich Armengol, Raquel¹, Autor
Kasian, Olga³, Autor
Choi, Pyuck-Pa⁴, Autor
Stephenson, Leigh², Autor
Gault, Baptiste², Autor
Scheu, Christina¹, Autor

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
3Electrocatalysis, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863354
4Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22