Distance-dependent noise measurements in scanning force microscopy

Roters, A.; Johannsmann, Diethelm

doi:10.1088/0953-8984/8/41/006

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Distance-dependent noise measurements in scanning force microscopy

Roters, A., & Johannsmann, D. (1996). Distance-dependent noise measurements in scanning force microscopy. Journal of Physics: Condensed Matter, 8(41), 7561-7577. doi:10.1088/0953-8984/8/41/006.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-B91C-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-B91D-8

Genre: Journal Article

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Creators:
Roters, A.¹, Author
Johannsmann, Diethelm¹, Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 1996

Publication Status: Issued

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Identifiers: DOI: 10.1088/0953-8984/8/41/006

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Title: Journal of Physics: Condensed Matter

Source Genre: Journal

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Publ. Info: Bristol : IOP Publishing

Pages: - Volume / Issue: 8 (41) Sequence Number: - Start / End Page: 7561 - 7577 Identifier: ISSN: 0953-8984
CoNE: https://pure.mpg.de/cone/journals/resource/954928562478