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  Measuring the Three-Dimensional Structure of Ultrathin Insulating Films at the Atomic Scale

Baumann, S., Rau, I. G., Loth, S., Lutz, C. P., & Heinrich, A. J. (2014). Measuring the Three-Dimensional Structure of Ultrathin Insulating Films at the Atomic Scale. ACS Nano, 8(2), 1739-1744. doi:10.1021/nn4061034.

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externe Referenz:
http://dx.doi.org/10.1021/nn4061034 (Verlagsversion)
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 Urheber:
Baumann, Susanne1, 2, Autor
Rau, Ileana G.1, Autor
Loth, S.3, 4, Autor           
Lutz, Christopher P.1, Autor
Heinrich, Andreas J.1, Autor
Affiliations:
1 IBM Almaden Research Center, 650 Harry Road, San Jose, California 95120, United States, ou_persistent22              
2Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland, ou_persistent22              
3Dynamics of Nanoelectronic Systems, Independent Research Groups, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society, ou_1938290              
4Max Planck Institute for Solid State Research, 70569 Stuttgart, Germany, ou_persistent22              

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Schlagwörter: magnesium oxide; atomic force microscopy; conductive AFM; scanning tunneling microscopy; thickness determination; thin oxide films; thin insulating films
 Zusammenfassung: The increasing technological importance of thin insulating layers calls for a thorough understanding of their structure. Here we apply scanning probe methods to investigate the structure of ultrathin magnesium oxide (MgO) which is the insulating material of choice in spintronic applications. A combination of force and current measurements gives high spatial resolution maps of the local three-dimensional insulator structure. When force measurements are not available, a lower spatial resolution can be obtained from tunneling images at different voltages. These broadly applicable techniques reveal a previously unknown complexity in the structure of MgO on Ag(001), such as steps in the insulator–metal interface.

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Sprache(n): eng - English
 Datum: 2013-11-272013-12-302013-12-302014-02-25
 Publikationsstatus: Erschienen
 Seiten: 6
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.1021/nn4061034
BibTex Citekey: doi:10.1021/nn4061034
 Art des Abschluß: -

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Titel: ACS Nano
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: Washington, DC : American Chemical Society
Seiten: - Band / Heft: 8 (2) Artikelnummer: - Start- / Endseite: 1739 - 1744 Identifikator: Anderer: 1936-0851
CoNE: https://pure.mpg.de/cone/journals/resource/1936-0851