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  New concepts for 3d optics in x-ray microscopy

Sanli, U.-T., Ceylan, H., Jiao, C., Baluktsian, M., Grevent, C., Hahn, K., et al. (2018). New concepts for 3d optics in x-ray microscopy. Microscopy and Microanalysis, 24(Suppl 2), 288-289. doi:10.1017/S1431927618013788.

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 Creators:
Sanli, U.-T.1, Author           
Ceylan, H.2, Author           
Jiao, C.3, Author
Baluktsian, M.1, Author           
Grevent, C.1, Author           
Hahn, K.4, Author
Wang, Yi4, Author
Srot, Vesna4, Author
Richter, G.5, Author           
Bykova, I.1, Author           
Weigand, M.1, Author           
Sitti, M.2, 6, Author           
Schütz, G.1, Author           
Keskinbora, K.1, Author           
Affiliations:
1Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648              
2Dept. Physical Intelligence, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_2054292              
3Thermo Fisher Scientific, 5651 GG Eindhoven, The Netherlands, ou_persistent22              
4Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, 70569 Stuttgart, Germany, ou_persistent22              
5Central Scientific Facility Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              
6Dept. of Mechanical Engineering, Carnegie Mellon University, ou_persistent22              

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Free keywords: Abt. Schütz; Abt. Sitti; ZWE Materialien
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Language(s): eng - English
 Dates: 2018-08-162018-08
 Publication Status: Issued
 Pages: 2
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1017/S1431927618013788
 Degree: -

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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: New York, NY : Cambridge University Press
Pages: - Volume / Issue: 24 (Suppl 2) Sequence Number: - Start / End Page: 288 - 289 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414