Statistical Reliability of Phase Fraction Determination Based on Electron 
Backscatter Diffraction (EBSD) Investigations on the Example of an Al-TRIP Steel

Davut, K.; Zaefferer, S.

doi:10.1007/s11661-010-0315-2

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Statistical Reliability of Phase Fraction Determination Based on Electron Backscatter Diffraction (EBSD) Investigations on the Example of an Al-TRIP Steel

Davut, K., & Zaefferer, S. (2010). Statistical Reliability of Phase Fraction Determination Based on Electron Backscatter Diffraction (EBSD) Investigations on the Example of an Al-TRIP Steel. Metallurgical and Materials Transactions A, 41(9), 2187-2196. doi:10.1007/s11661-010-0315-2.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3BF6-D Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3BF8-9

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Urheber:
Davut, K.¹, Autor
Zaefferer, S.¹, Autor

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391