Developement of a TEM-based Orientation Microscopy System and its Application 
to Study of Microstructure and Texture of Nanocrystalline NiCo Samples

Wu, G.; Zaefferer, S.

Local TagsRelease HistoryDetailsSummary

Developement of a TEM-based Orientation Microscopy System and its Application to Study of Microstructure and Texture of Nanocrystalline NiCo Samples

Wu, G., & Zaefferer, S. (2008). Developement of a TEM-based Orientation Microscopy System and its Application to Study of Microstructure and Texture of Nanocrystalline NiCo Samples. Talk presented at 15th International Conference on the Texture of Materials (ICOTOM 15). Pittsburgh, PA, USA. 2008-06-01 - 2008-06-06.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-4919-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-491B-C

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Wu, G.¹, Author
Zaefferer, S.¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

Content

show

Details

show

hide

Language(s): eng - English

Dates:

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 366672

Degree: -

Event

show

hide

Title: 15th International Conference on the Texture of Materials (ICOTOM 15)

Place of Event: Pittsburgh, PA, USA

Start-/End Date: 2008-06-01 - 2008-06-06

Legal Case

show

Project information

show

Source

show