Conventional TEM Investigation of the FIB Damage in Copper

Kiener, Daniel; Jörg, T.; Rester, Martin; Motz, Christian; Dehm, Gerhard

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Conventional TEM Investigation of the FIB Damage in Copper

Kiener, D., Jörg, T., Rester, M., Motz, C., & Dehm, G. (2007). Conventional TEM Investigation of the FIB Damage in Copper. In Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie (pp. 100-101).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-A5C5-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002E-A5CD-C

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Creators:
Kiener, Daniel¹, Author
Jörg, T.², Author
Rester, Martin³, Author
Motz, Christian³, Author
Dehm, Gerhard¹, Author

Affiliations:
1Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22
2Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, A-8700 Leoben, Austria, persistent22
3Department of Materials Physics, Montanuniversität Leoben, Leoben, Austria, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 2007

Publication Status: Issued

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Title: 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie

Place of Event: Saarbrücken, Germany

Start-/End Date: 2007-09-02 - 2007-09-07

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Title: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie

Source Genre: Proceedings

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Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 100 - 101 Identifier: -