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  Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries

Stoffers, A., Barthel, J., Liebscher, C., Gault, B., Cojocaru-Mirédin, O., Scheu, C., et al. (2017). Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries. Microscopy and Microanalysis, 23(2), 291-299. doi:10.1017/S1431927617000034.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-A6A6-B Version Permalink: https://hdl.handle.net/21.11116/0000-0005-9AC2-2
Genre: Journal Article

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 Creators:
Stoffers, Andreas1, 2, Author           
Barthel, Juri3, 4, Author           
Liebscher, Christian5, Author           
Gault, Baptiste6, Author           
Cojocaru-Mirédin, Oana1, 7, Author           
Scheu, Christina8, Author           
Raabe, Dierk1, Author           
Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
2Institute of Physics (IA), RWTH Aachen University, Otto-Blumenthal-Straße, 52074 Aachen, Germany, ou_persistent22              
3Central Facility for Electron Microscopy, RWTH Aachen University, Ahornstraβe 55, 52074 Aachen, Germany, ou_persistent22              
4Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany, ou_persistent22              
5Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863399              
6Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
7I. Physikalisches Institut (IA), RWTH Aachen, 52074 Aachen, Germany, ou_persistent22              
8Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              

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Language(s): eng - English
 Dates: 2017-02-202017-04
 Publication Status: Issued
 Pages: -
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 Rev. Type: Peer
 Identifiers: DOI: 10.1017/S1431927617000034
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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
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Pages: - Volume / Issue: 23 (2) Sequence Number: - Start / End Page: 291 - 299 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414