Scanning X-ray microdiffraction with submicrometer white beam for strain/stress 
and orientation mapping in thin films

Tamura, N.; MacDowell, A. A.; Spolenak, R.; Valek, B. C.; Bravman, J. C.; Brown, W. L.; Celestre, R. S.; Padmore, H. A.; Batterman, B. W.; Patel, J. R.

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Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films

Tamura, N., MacDowell, A. A., Spolenak, R., Valek, B. C., Bravman, J. C., Brown, W. L., et al. (2003). Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films. Journal of Synchrotron Radiation, 10, 137-143.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2E08-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2E09-1

Genre: Journal Article

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Creators:
Tamura, N., Author
MacDowell, A. A., Author
Spolenak, R.¹, Author
Valek, B. C., Author
Bravman, J. C., Author
Brown, W. L., Author
Celestre, R. S., Author
Padmore, H. A., Author
Batterman, B. W., Author
Patel, J. R., Author

Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655

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Free keywords: MPI für Metallforschung; Abt. Arzt;

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Identifiers: eDoc: 55935

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Title: Journal of Synchrotron Radiation

Source Genre: Journal

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Pages: - Volume / Issue: 10 Sequence Number: - Start / End Page: 137 - 143 Identifier: -