Characterization of Cu(In,Ga)Se2 grain boundaries using atom probe tomography

Cojocaru-Mirédin, O.; Schwarz, T.; Choi, P.; Würz, R.; Raabe, D.

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Characterization of Cu(In,Ga)Se₂ grain boundaries using atom probe tomography

Cojocaru-Mirédin, O., Schwarz, T., Choi, P., Würz, R., & Raabe, D. (2013). Characterization of Cu(In,Ga)Se₂ grain boundaries using atom probe tomography. Poster presented at 2013 MRS Spring Meeting & Exhibit, San Francisco, CA, USA.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-2440-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-9162-B

Genre: Poster

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Creators:
Cojocaru-Mirédin, O.¹, Author
Schwarz, T.², Author
Choi, P.², Author
Würz, R., Author
Raabe, D.³, Author

Affiliations:
1Interface Design in Solar Cells, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863387
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381

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Language(s): eng - English

Dates: Created: 2013-04

Publication Status: Not specified

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Identifiers: eDoc: 655852

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Title: 2013 MRS Spring Meeting & Exhibit

Place of Event: San Francisco, CA, USA

Start-/End Date: 2013-04-01 - 2013-04-05

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