Correlative transmission EBSD-APT analysis of grain boundaries in Cu(In,Ga)Se2 
and Cu2ZnSnSe4 based thin-film solar cells

Schwarz, Torsten; Stechmann, Guillaume; Gault, Baptiste; Cojocaru-Mirédin, Oana; Choi, Pyuck-Pa; Redinger, Alex; Siebentritt, Susanne; Raabe, Dierk

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Correlative transmission EBSD-APT analysis of grain boundaries in Cu(In,Ga)Se₂ and Cu₂ZnSnSe₄ based thin-film solar cells

Schwarz, T., Stechmann, G., Gault, B., Cojocaru-Mirédin, O., Choi, P.-P., Redinger, A., et al. (2017). Correlative transmission EBSD-APT analysis of grain boundaries in Cu(In,Ga)Se₂ and Cu₂ZnSnSe₄ based thin-film solar cells. Talk presented at Microscopy & Microanalysis. St. Louis, Missouri, USA. 2017-08-06 - 2017-08-10.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-94C5-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-94C6-0

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Creators:
Schwarz, Torsten¹, Author
Stechmann, Guillaume², Author
Gault, Baptiste¹, Author
Cojocaru-Mirédin, Oana^{2, 3}, Author
Choi, Pyuck-Pa⁴, Author
Redinger, Alex⁵, Author
Siebentritt, Susanne⁵, Author
Raabe, Dierk², Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
3RWTH Aachen, I. Physikalisches Institut IA, Aachen, Germany, ou_persistent22
4Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22
5University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22

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Language(s): eng - English

Dates: Created: 2017-08

Publication Status: Not specified

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Title: Microscopy & Microanalysis

Place of Event: St. Louis, Missouri, USA

Start-/End Date: 2017-08-06 - 2017-08-10

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