Grain boundary segregation in multicrystalline Silicon studied by correlative 
microscopy

Stoffers, Andreas

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Grain boundary segregation in multicrystalline Silicon studied by correlative microscopy

Stoffers, A. (2017). Grain boundary segregation in multicrystalline Silicon studied by correlative microscopy. PhD Thesis, RWTH Aachen, Aachen, Germany.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-3CFE-0 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0000-3CFF-F

Genre: Hochschulschrift

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Urheber:
Stoffers, Andreas¹, Autor
Raabe, Dierk¹, Gutachter
Mayer, Joachim², Gutachter
Schneider, Jochen Michael³, Gutachter

Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
2Central Facility for Electron Microscopy, RWTH Aachen University, Aachen, Germany, ou_persistent22
3Materials Chemistry, Lehrstuhl für Werkstoffchemie, RWTH Aachen, Germany, ou_persistent22