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  Post-Issue Patent Quality Control: A Comparative Study of US Patent Re-Examinations and European Patent Oppositions

Graham, S. J. H., Hall, B. H., Harhoff, D., & Mowery, D. C. (2003). Post-Issue Patent Quality Control: A Comparative Study of US Patent Re-Examinations and European Patent Oppositions. In W. M. Cohen, & S. A. Merrill (Eds.), Patents in the Knowledge-Based Economy (pp. 74-119). Washington, D. C.: The National Academic Press.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-B972-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-B973-E
Genre: Contribution to Collected Edition

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 Creators:
Graham, Stuart J. H.1, Author
Hall, Bronwyn H.1, Author
Harhoff, Dietmar1, Author           
Mowery, David C.1, Author
Affiliations:
1External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates: 2003
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
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Title: Patents in the Knowledge-Based Economy
Source Genre: Collected Edition
 Creator(s):
Cohen, Wesley M. 1, Editor
Merrill, S. A.1, Editor
Affiliations:
1 External Organizations, ou_persistent22            
Publ. Info: Washington, D. C. : The National Academic Press
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 74 - 119 Identifier: ISBN: 0-309-08636-1