Real-time investigation of ZnO growth on Zn by spectroscopic ellipsometry

Chen, Y.; Zuo, J.; Schneider, P.; Erbe, A.

Local TagsRelease HistoryDetailsSummary

Real-time investigation of ZnO growth on Zn by spectroscopic ellipsometry

Chen, Y., Zuo, J., Schneider, P., & Erbe, A. (2010). Real-time investigation of ZnO growth on Zn by spectroscopic ellipsometry. Poster presented at 3rd NanoCharm Workshop on Non-Destructive Real Time Process Control, Berlin, Germany.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-3673-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0002-9176-5

Genre: Poster

Files

show Files

Locators

show

Creators

show

hide

Creators:
Chen, Y.¹, Author
Zuo, J.², Author
Schneider, P.¹, Author
Erbe, A.¹, Author

Affiliations:
1Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358
2External Organizations, ou_persistent22

Content

show

Details

show

hide

Language(s): eng - English

Dates: Created: 2010-10

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 498459

Degree: -

Event

show

hide

Title: 3rd NanoCharm Workshop on Non-Destructive Real Time Process Control

Place of Event: Berlin, Germany

Start-/End Date: 2010-10

Legal Case

show

Project information

show

Source

show