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  High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations

Katnagallu, S., Nematollahi, G. A., Dagan, M., Moody, M. P., Grabowski, B., Gault, B., et al. (2017). High Fidelity Reconstruction of Experimental Field Ion Microscopy Data by Atomic Relaxation Simulations. In Proceedings of Microscopy & Microanaalysis 2017 (pp. 642-643). New York, NY, USA: Cambridge University Press. doi:10.1017/S1431927617003877.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-4963-E Version Permalink: https://hdl.handle.net/21.11116/0000-0001-4964-D
Genre: Conference Paper

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 Creators:
Katnagallu, Shyam1, Author           
Nematollahi, Gholamali Ali2, Author           
Dagan, Michal3, Author           
Moody, Michael P.4, Author           
Grabowski, Blazej2, Author           
Gault, Baptiste1, Author           
Raabe, Dierk5, Author           
Neugebauer, Jörg6, Author           
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Adaptive Structural Materials (Simulation), Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863339              
3Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH UK, persistent22              
4Department of Materials, University of Oxford, Parks Road, Oxford OX13PH, UK, ou_persistent22              
5Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381              
6Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863337              

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Language(s): eng - English
 Dates: 2017-08-042017-07
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1017/S1431927617003877
 Degree: -

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Title: Microscopy and Microanalysis 2017
Place of Event: St. Louis, MO, USA
Start-/End Date: 2017-08-06 - 2017-08-10

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Title: Proceedings of Microscopy & Microanaalysis 2017
Source Genre: Proceedings
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Publ. Info: New York, NY, USA : Cambridge University Press
Pages: - Volume / Issue: 23 (S1) Sequence Number: - Start / End Page: 642 - 643 Identifier: -