Investigation of solid state dewetting phenomena of epitaxial Al thin films on 
sapphire using electron microscopy

Hieke, Stefan Werner; Dehm, Gerhard; Scheu, Christina

Local TagsRelease HistoryDetailsSummary

Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy

Hieke, S. W., Dehm, G., & Scheu, C. (2016). Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. Talk presented at The 16th European Microscopy Congress (EMC 2016). Lyon, France. 2016-08-28 - 2016-09-02.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0023-C731-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-6CD9-2

Genre: Talk

Files

show Files

Locators

show

Creators

show

hide

Creators:
Hieke, Stefan Werner¹, Author
Dehm, Gerhard², Author
Scheu, Christina³, Author

Affiliations:
1Nanoanalytics and Interfaces, Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398
3Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294

Content

show

Details

show

hide

Language(s): eng - English

Dates: Created: 2016

Publication Status: Not specified

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: -

Degree: -

Event

show

hide

Title: The 16th European Microscopy Congress (EMC 2016)

Place of Event: Lyon, France

Start-/End Date: 2016-08-28 - 2016-09-02

Legal Case

show

Project information

show

Source

show