3D Reconstruction of Identical Location Electron Micrographs – Methodology and 
Pitfalls

Gänsler, Thomas; Hengge, Katharina Anna; Scheu, Christina

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3D Reconstruction of Identical Location Electron Micrographs – Methodology and Pitfalls

Gänsler, T., Hengge, K. A., & Scheu, C. (2019). 3D Reconstruction of Identical Location Electron Micrographs – Methodology and Pitfalls. Poster presented at IAMNano 2019, International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, Düsseldorf, Germany.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0005-6F28-3 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0005-6F29-2

Genre: Poster

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Urheber:
Gänsler, Thomas¹, Autor
Hengge, Katharina Anna¹, Autor
Scheu, Christina¹, Autor

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294