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  Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity

Dehm, G., Balk, T. J., von Blanckenhagen, B., Gumbsch, P., & Arzt, E. (2002). Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques, 93(5), 383-391. doi:10.3139/146.020383.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-975C-E Version Permalink: https://hdl.handle.net/21.11116/0000-0001-975D-D
Genre: Journal Article

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 Creators:
Dehm, Gerhard1, Author           
Balk, Thomas John1, Author           
von Blanckenhagen, Burghard1, Author           
Gumbsch, Peter1, Author           
Arzt, Eduard1, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              

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Free keywords: MPI für Metallforschung; Abt. Arzt; 06-ar_2002; thin film plasticity; discrete dislocation dynamics; constrained diffusional creep; in situ TEM; thermal stress
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Language(s): eng - English
 Dates: 2002-05
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 6778
ISI: 000176310600007
DOI: 10.3139/146.020383
 Degree: -

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Title: Zeitschrift für Metallkunde/Materials Research and Advanced Techniques
  Other : Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques
  Abbreviation : Z. Metallk.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: München : Hanser
Pages: - Volume / Issue: 93 (5) Sequence Number: - Start / End Page: 383 - 391 Identifier: ISSN: 0044-3093
CoNE: https://pure.mpg.de/cone/journals/resource/1000000000221480