Towards New Insights on Interface Controlled Materials by Advanced Electron 
Microscopy

Dehm, Gerhard; Harzer, Tristan Philipp; Völker, Bernhard; Imrich, Peter Julian; Zhang, Zaoli

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Towards New Insights on Interface Controlled Materials by Advanced Electron Microscopy

Dehm, G., Harzer, T. P., Völker, B., Imrich, P. J., & Zhang, Z. (2015). Towards New Insights on Interface Controlled Materials by Advanced Electron Microscopy. Talk presented at Frontiers of Electron Microscopy in Materials Science Meeting (FEMMS 2015). Lake Tahoe, CA, USA. 2015-09-13 - 2015-09-18.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-3170-5 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0001-5FD2-8

Genre: Vortrag

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Urheber:
Dehm, Gerhard¹, Autor
Harzer, Tristan Philipp¹, Autor
Völker, Bernhard², Autor
Imrich, Peter Julian², Autor
Zhang, Zaoli³, Autor

Affiliations:
1Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863398
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22
3Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22