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  A Comparison of the Electronic Structure of N–K in TiN and VN using EELS and Ab-initio Calculations

Rashkova, B., Kothleitner, G., Šturm, S., Scheu, C., Kutschej, K., Mitterer, C., et al. (2007). A Comparison of the Electronic Structure of N–K in TiN and VN using EELS and Ab-initio Calculations. In Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie (pp. 414-415).

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 Creators:
Rashkova, Boryana1, Author           
Kothleitner, Gerald2, Author           
Šturm, Sašo3, Author           
Scheu, Christina4, Author           
Kutschej, Kerstin5, Author           
Mitterer, Christian6, Author           
Lazar, Petr7, Author           
Redinger, Josef7, Author           
Podloucky, Raimund8, Author           
Dehm, Gerhard9, Author           
Affiliations:
1Department of Materials Physics, University of Leoben, Jahnstr.12, A-8700 Leoben, Austria, ou_persistent22              
2Institut für Elektronenmikroskopie und Nanoanalytik, Technische Universität Graz, Austria, ou_persistent22              
3Institut Jožef Stefan, Department for Nanostructured Materials, Ljubljana, Slovenia, ou_persistent22              
4Department of Chemistry and Center for NanoScience (CeNS), Ludwig-Maximilians Universität München, Germany, ou_persistent22              
5Department of Physical Metallurgy and Materials Testing, University of Leoben, Franz-Josef-Str. 18, A-8700 Leoben, Austria, ou_persistent22              
6Department of Physical Metallurgy and Materials Testing, Christian-Doppler Laboratory for Advanced Coatings, University of Leoben, Austria, ou_persistent22              
7Institute of Applied Physics, Vienna University of Technology, Vienna, Austria, ou_persistent22              
8Department of Physical Chemistry, Vienna University, Vienna, Austria, ou_persistent22              
9Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2007
 Publication Status: Issued
 Pages: -
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Title: Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie
Place of Event: Saarbrücken, Germany
Start-/End Date: 2007-09-02 - 2007-09-07

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Title: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie
Source Genre: Proceedings
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Affiliations:
Publ. Info: -
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 414 - 415 Identifier: -