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  Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements.

Kuru, Y., Wohlschlögel, M., Welzel, U., & Mittemeijer, E. J. (2009). Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements. Powder Diffraction, 24, 85-88. doi:10.1154/1.3125550.

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 Creators:
Kuru, Y.1, Author           
Wohlschlögel, M.1, Author           
Welzel, U.1, Author           
Mittemeijer, E. J.1, 2, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 451155
DOI: 10.1154/1.3125550
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Title: Powder Diffraction
Source Genre: Journal
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Pages: - Volume / Issue: 24 Sequence Number: - Start / End Page: 85 - 88 Identifier: -