A perspective on the ion projection in field ion & atom probe microscopy

Gault, Baptiste; De Geuser, Frédéric

Lokale TagsFreigabegeschichteDetailsÜbersicht

A perspective on the ion projection in field ion & atom probe microscopy

Gault, B., & De Geuser, F. (2016). A perspective on the ion projection in field ion & atom probe microscopy. Talk presented at Atom Probe Tomography & Microscopy 2016. Gyeongju, South Korea. 2016-06-12 - 2016-06-17.

Item is Freigegeben

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:

Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-101A-8 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-002D-C556-7

Genre: Vortrag

ausblenden:

Urheber:
Gault, Baptiste¹, Autor
De Geuser, Frédéric^{2, 3}, Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2CNRS, SIMAP, F-38000 Grenoble, France, persistent22
3Université Grenoble Alpes, SIMAP, F-38000 Grenoble, France, persistent22