Low-temperature electrical resistivity of Yb1-xLaxRh2Si2

Weickert, F.; Gegenwart, P.; Ferstl, J.; Geibel, C.; Steglich, F.

doi:10.1016/j.physb.2006.01.029

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Low-temperature electrical resistivity of Yb_1-xLa_xRh₂Si₂

Weickert, F., Gegenwart, P., Ferstl, J., Geibel, C., & Steglich, F. (2006). Low-temperature electrical resistivity of Yb_1-xLa_xRh₂Si₂. Physica B, 378-380, 72-73. doi:10.1016/j.physb.2006.01.029.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0015-2AF5-6 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0000-1F3C-C

Genre: Zeitschriftenartikel

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Urheber:
Weickert, F.¹, Autor
Gegenwart, P.², Autor
Ferstl, J.¹, Autor
Geibel, C.³, Autor
Steglich, F.⁴, Autor

Affiliations:
1Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863404
2Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863462
3Christoph Geibel, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863465
4Frank Steglich, Physics of Quantum Materials, Max Planck Institute for Chemical Physics of Solids, Max Planck Society, ou_1863467