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  A critical review of orientation microscopy techniques in SEM and TEM

Zaefferer, S., & Wu, G. (2010). A critical review of orientation microscopy techniques in SEM and TEM. Talk presented at Facets of Electron Crystallography. Berlin, Germany. 2010-07-08.

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 Creators:
Zaefferer, S.1, Author           
Wu, G.2, Author           
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              
2External Organizations, ou_persistent22              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 498748
 Degree: -

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Title: Facets of Electron Crystallography
Place of Event: Berlin, Germany
Start-/End Date: 2010-07-08
Invited: Yes

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