Profile Correction to Electron Temperature and Enhancement Factor in Soft-X-Ray 
Pulse-Height-Analysis Measurements in Tokamaks

Sesnic, S.; Diesso, M.; Hill, K.; Pohl, F.; et al.,

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Profile Correction to Electron Temperature and Enhancement Factor in Soft-X-Ray Pulse-Height-Analysis Measurements in Tokamaks

Sesnic, S., Diesso, M., Hill, K., Pohl, F., & et al. (1988). Profile Correction to Electron Temperature and Enhancement Factor in Soft-X-Ray Pulse-Height-Analysis Measurements in Tokamaks. Review of Scientific Instruments, 59, 8, 1810-1812.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-C255-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-C256-5

Genre: Journal Article

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Sesnic, S.¹, Author
Diesso, M.², Author
Hill, K.², Author
Pohl, F.¹, Author
et al.², Author

Affiliations:
1Max Planck Institute for Plasma Physics, ou_persistent27
2External Organizations, ou_persistent22

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Dates: Date issued: 1988

Publication Status: Issued

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 59, 8 Sequence Number: - Start / End Page: 1810 - 1812 Identifier: -