Guided mass spectrum labelling in atom probe tomography

Haley, Daniel; Choi, Pyuck-Pa; Raabe, Dierk

doi:10.1016/j.ultramic.2015.03.005

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Guided mass spectrum labelling in atom probe tomography

Haley, D., Choi, P.-P., & Raabe, D. (2015). Guided mass spectrum labelling in atom probe tomography. Ultramicroscopy, 159(2), 338-345. doi:10.1016/j.ultramic.2015.03.005.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-3DEF-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-3DF0-9

Genre: Journal Article

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Creators:
Haley, Daniel^{1, 2}, Author
Choi, Pyuck-Pa³, Author
Raabe, Dierk¹, Author

Affiliations:
1Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
2University of Oxford, Department of Materials, Parks RoadOxford, UK, ou_persistent22
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384

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Language(s): eng - English

Dates: Date issued: 2015-12

Publication Status: Issued

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Identifiers: ISI: 000366220100028
DOI: 10.1016/j.ultramic.2015.03.005

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Title: Ultramicroscopy

Abbreviation : Ultramicroscopy

Source Genre: Journal

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Publ. Info: Amsterdam : North-Holland

Pages: - Volume / Issue: 159 (2) Sequence Number: - Start / End Page: 338 - 345 Identifier: ISSN: 0304-3991
CoNE: https://pure.mpg.de/cone/journals/resource/954925512451