ausblenden:
Schlagwörter:
transmission electron microscopy,
CCD camera,
noise reduction,
cosmic rays,
x-ray noise,
dark reference
Zusammenfassung:
This publication is a systematic investigation of the effect the improvement of dark-reference images has on the resulting bright-field images. For this, data were acquired with three different charge-coupled device cameras attached to two different transmission electron microscopes. Multi-frame acquisitions and methods to correct x-ray noise are introduced and quantified as options to improve the dark-reference images. Furthermore, the influence of x-ray noise on transmission electron microscopy measurements is discussed and observations on its composition are shared.
