ARHVTEM of the Pd/ZnO heterointerface chemical structure

Murakami, K.; Saito, M.; Takuma, E.; Ichinose, H.

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ARHVTEM of the Pd/ZnO heterointerface chemical structure

Murakami, K., Saito, M., Takuma, E., & Ichinose, H. (2003). ARHVTEM of the Pd/ZnO heterointerface chemical structure. Journal of Electron Microscopy, 52(1), 27-32.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2EFB-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2EFC-0

Genre: Journal Article

Alternative Title : J. Electron Microsc.

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Creators:
Murakami, K.¹, Author
Saito, M.^{2, 3}, Author
Takuma, E.¹, Author
Ichinose, H.¹, Author

Affiliations:
1Univ Tokyo, Dept Mat Sci, Sch Engn, Tokyo 1130033, Japan.;, ou_persistent22
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655

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Free keywords: MPI für Metallforschung; Abt. Rühle; HVTEM, ZnO/Pd interface, interface chemical structure, internal oxidation, projected potential image

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Identifiers: eDoc: 112701
ISI: 000182216800005

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Title: Journal of Electron Microscopy

Alternative Title : J. Electron Microsc.

Source Genre: Journal

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Pages: - Volume / Issue: 52 (1) Sequence Number: - Start / End Page: 27 - 32 Identifier: ISSN: 0022-0744