Trapping of transient processes in aluminium oxide thin films in a voltage 
pulse experiment

Hassel, A. W.; Diesing, D.

Local TagsRelease HistoryDetailsSummary

Trapping of transient processes in aluminium oxide thin films in a voltage pulse experiment

Hassel, A. W., & Diesing, D. (2002). Trapping of transient processes in aluminium oxide thin films in a voltage pulse experiment. Electrochemistry Communications, 4, 1-4.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6F07-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0019-6F09-2

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Hassel, A. W.¹, Author
Diesing, D., Author

Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355

Content

show

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2002

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 12919

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Electrochemistry Communications

Alternative Title : Electrochem. Commun.

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 4 Sequence Number: - Start / End Page: 1 - 4 Identifier: -