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  Structural, electronic and optical characterization of ZnO thin film-seeded platforms for ZnO nanostructures: sol–gel method versus ab initio calculations

Al-Bataineh, Q. M., Alsaad, A. M., Ahmad, A. A., & Al-Sawalmih, A. (2019). Structural, electronic and optical characterization of ZnO thin film-seeded platforms for ZnO nanostructures: sol–gel method versus ab initio calculations. Journal of Electronic Materials, 48(8), 5028-5038. doi:10.1007/s11664-019-07303-6.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0004-4C16-F Version Permalink: https://hdl.handle.net/21.11116/0000-0004-4C17-E
Genre: Journal Article

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Al-Bataineh, Qais M., Author
Alsaad, A. M., Author
Ahmad, A. A., Author
Al-Sawalmih, A.1, Author           
Affiliations:
1Biomaterialien, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863285              

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Free keywords: ZnO thin films, sol–gel process, dip coating, nanostructures, optical properties, structural properties, DFT, VASP
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Language(s): eng - English
 Dates: 2019-05-292019
 Publication Status: Issued
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 Identifiers: DOI: 10.1007/s11664-019-07303-6
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Title: Journal of Electronic Materials
  Other : J. Electron. Mater.
Source Genre: Journal
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Publ. Info: Warrendale, PA, etc. : Minerals, Metals & Materials Society and IEEE [etc.]
Pages: - Volume / Issue: 48 (8) Sequence Number: - Start / End Page: 5028 - 5038 Identifier: ISSN: 0361-5235