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  Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces

Dehm, G., Raj, R., & Rühle, M. (1996). Influence of Interfacial Layers on the Ultimate Shear Strength of Copper/Sapphire Interfaces. Materials Science Forum, 207-209(2), 597-600. doi:10.4028/www.scientific.net/MSF.207-209.597.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-9560-A Version Permalink: https://hdl.handle.net/21.11116/0000-0001-9561-9
Genre: Journal Article

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 Creators:
Dehm, Gerhard1, Author           
Raj, Rishi2, Author           
Rühle, Manfred3, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2Department of Materials Science and Engineering, Cornell University, Bard Hall, Ithaca, NY, 14853-1501, USA, persistent22              
3Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              

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Language(s): eng - English
 Dates: 1996
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.4028/www.scientific.net/MSF.207-209.597
 Degree: -

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Title: Materials Science Forum
  Abbreviation : Mater. Sci. Forum
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 207-209 (2) Sequence Number: - Start / End Page: 597 - 600 Identifier: ISSN: 0255-5476
CoNE: https://pure.mpg.de/cone/journals/resource/954928550320