Optimizing multiple beam interferometryin the surface forces apparatus: Novel 
optics,reflection mode modeling, metal layerthicknesses, birefringence, and 
rotationof anisotropic layers

Schwenzfeier, Kai; Erbe, Andreas; Bilotto, Pierluigi; Lengauer, Maximilian; Merola, Claudia; Cheng, Hsiu-Wei; Mears, Laura L. E.; Valtiner, Markus

doi:10.1063/1.5085210

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Optimizing multiple beam interferometryin the surface forces apparatus: Novel optics,reflection mode modeling, metal layerthicknesses, birefringence, and rotationof anisotropic layers

Schwenzfeier, K., Erbe, A., Bilotto, P., Lengauer, M., Merola, C., Cheng, H.-W., et al. (2019). Optimizing multiple beam interferometryin the surface forces apparatus: Novel optics,reflection mode modeling, metal layerthicknesses, birefringence, and rotationof anisotropic layers. Review of Scientific Instruments, 90: 043908. doi:10.1063/1.5085210.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0003-7E18-6 Version Permalink: https://hdl.handle.net/21.11116/0000-0003-7E1E-0

Genre: Journal Article

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Creators:
Schwenzfeier, Kai¹, Author
Erbe, Andreas^{2, 3}, Author
Bilotto, Pierluigi¹, Author
Lengauer, Maximilian¹, Author
Merola, Claudia¹, Author
Cheng, Hsiu-Wei⁴, Author
Mears, Laura L. E.¹, Author
Valtiner, Markus⁵, Author

Affiliations:
1Institute for Applied Physics, Vienna University of Technology, Wiedner Hauptstrasse 8-10, A-1040 Vienna, Austria, ou_persistent22
2Department of Materials Science and Engineering, NTNU - Norwegian University of Science and Technology, 7491 Trondheim, Norway, ou_persistent22
3Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863358
4Institute of Applied Physics, Vienna University of Technology, Vienna, Austria, ou_persistent22
5Institute of Applied Synthetic Chemistry, Vienna University of Technology, Getreidemarkt 9/163-AC, A-1060 Vienna, Austria, ou_persistent22

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Language(s): eng - English

Dates: Submitted: 2018-12-10Accepted: 2019-03-25Published Online: 2019-04-19Date issued: 2019

Publication Status: Issued

Pages: -

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Table of Contents: -

Rev. Type: Peer

Identifiers: DOI: 10.1063/1.5085210

Degree: -

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Title: Review of Scientific Instruments

Abbreviation : Rev. Sci. Instrum.

Source Genre: Journal

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Publ. Info: Melville, NY : AIP Publishing

Pages: 14 Volume / Issue: 90 Sequence Number: 043908 Start / End Page: - Identifier: ISSN: 0034-6748
CoNE: https://pure.mpg.de/cone/journals/resource/991042742033452