The +/-45 degrees correlation interferometer as a means to measure phase noise 
of parametric origin

Rubiola, E.; Giordano, V.; Stoll, H.

Local TagsRelease HistoryDetailsSummary

The +/-45 degrees correlation interferometer as a means to measure phase noise of parametric origin

Rubiola, E., Giordano, V., & Stoll, H. (2003). The +/-45 degrees correlation interferometer as a means to measure phase noise of parametric origin. IEEE Transactions on Instrumentation and Measurement, 52, 182-188.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2EAF-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2EB0-7

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Rubiola, E.¹, Author
Giordano, V.¹, Author
Stoll, H.^{2, 3}, Author

Affiliations:
1Univ Henri Poincare, LPMIA, ESSTIN, Nancy, France CNRS, LPMO, Besancon, France, ou_persistent22
2Former Central Scientific Facility ANKA Synchroton Beamline, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497651
3Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497648

Content

show

hide

Free keywords: MPI für Metallforschung; Abt. Schütz;

Abstract: -

Details

show

hide

Language(s):

Dates: Date issued: 2003

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: -

Identifiers: eDoc: 63708

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: IEEE Transactions on Instrumentation and Measurement

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 52 Sequence Number: - Start / End Page: 182 - 188 Identifier: -