Determination of a Depth Distribution of Implanted Helium in Niobium by 
Rutherford Backscattering

Roth, J.; Behrisch, R.; Scherzer, B.M.U.

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Determination of a Depth Distribution of Implanted Helium in Niobium by Rutherford Backscattering

Roth, J., Behrisch, R., & Scherzer, B. (1974). Determination of a Depth Distribution of Implanted Helium in Niobium by Rutherford Backscattering. Applied Physics Letters, 25, 11, 643-644.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A424-1 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-A425-0

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Urheber:
Roth, J.¹, Autor
Behrisch, R.¹, Autor
Scherzer, B.M.U.², Autor

Affiliations:
1Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
2External Organizations, ou_persistent22