Investigation of the fatigue behavior of Al thin films with different 
microstructure

Heinz, Walther; Pippan, Reinhard; Dehm, Gerhard

doi:10.1016/j.msea.2010.08.046

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Investigation of the fatigue behavior of Al thin films with different microstructure

Heinz, W., Pippan, R., & Dehm, G. (2010). Investigation of the fatigue behavior of Al thin films with different microstructure. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing, 527(29-30), 7757-7763. doi:10.1016/j.msea.2010.08.046.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-9220-5 Version Permalink: https://hdl.handle.net/21.11116/0000-0001-9221-4

Genre: Journal Article

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Creators:
Heinz, Walther¹, Author
Pippan, Reinhard¹, Author
Dehm, Gerhard^{1, 2}, Author

Affiliations:
1Erich Schmid Institute of Material Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22
2Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22

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Language(s): eng - English

Dates: Date issued: 2010-11-15

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1016/j.msea.2010.08.046

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Title: Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing

Abbreviation : Mater. Sci. Eng. A: Struct. Mater. Prop. Microstruct. Process.

Source Genre: Journal

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Pages: - Volume / Issue: 527 (29-30) Sequence Number: - Start / End Page: 7757 - 7763 Identifier: ISSN: 0921-5093
CoNE: https://pure.mpg.de/cone/journals/resource/954928498465_1