Physics of Electron Beam Ion Traps and Sources. Invited Paper

Currell, F.; Fußmann, G.

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Physics of Electron Beam Ion Traps and Sources. Invited Paper

Currell, F., & Fußmann, G. (2005). Physics of Electron Beam Ion Traps and Sources. Invited Paper. IEEE Transactions on Plasma Science, 33, 1763-1777.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-1ACA-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-1ACB-D

Genre: Journal Article

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Creators:
Currell, F.¹, Author
Fußmann, G.², Author

Affiliations:
1Queen's university of Belfast, Belfast BT7 1NN, Northern Ireland, U.K., ou_persistent22
2Plasma Diagnostics Group (HUB), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856324

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Language(s): eng - English

Dates: Date issued: 2005

Publication Status: Issued

Pages: -

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Table of Contents: -

Rev. Type: Peer

Identifiers: eDoc: 290950

Degree: -

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Title: IEEE Transactions on Plasma Science

Source Genre: Journal

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Publ. Info: IEEE

Pages: - Volume / Issue: 33 Sequence Number: - Start / End Page: 1763 - 1777 Identifier: ISSN: 0093-3813