Thickness dependent exchange bias in martensitic epitaxial Ni–Mn–Sn thin films

Behler, Anna; Teichert, Niclas; Dutta, Biswanath; Waske, Anja; Hickel, Tilmann; Auge, Alexander; Hütten, Andreas; Eckert, Jürgen

doi:10.1063/1.4849795

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Thickness dependent exchange bias in martensitic epitaxial Ni–Mn–Sn thin films

Behler, A., Teichert, N., Dutta, B., Waske, A., Hickel, T., Auge, A., et al. (2013). Thickness dependent exchange bias in martensitic epitaxial Ni–Mn–Sn thin films. AIP Advances, 3(12): 122112. doi:10.1063/1.4849795.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-B37A-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0024-B37F-7

Genre: Journal Article

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Creators:
Behler, Anna^{1, 2}, Author
Teichert, Niclas³, Author
Dutta, Biswanath⁴, Author
Waske, Anja¹, Author
Hickel, Tilmann⁴, Author
Auge, Alexander³, Author
Hütten, Andreas³, Author
Eckert, Jürgen^{1, 5}, Author

Affiliations:
1IFW Dresden, Institute for Complex Materials, P.O. Box 27 01 16, 01171 Dresden, Germany, ou_persistent22
2Department of Physics, Institute for Solid State Physics, Dresden University of Technology, 01062 Dresden, Germany, ou_persistent22
3Department of Physics, Thin Films and Physics of Nanostructures, Bielefeld University, 33501 Bielefeld, Germany, ou_persistent22
4Computational Phase Studies, Computational Materials Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863341
5TU Dresden, Institute of Materials Science, Helmholtzstr. 7, 01069 Dresden, Germany, ou_persistent22

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Language(s): eng - English

Dates: Submitted: 2013-09-05Accepted: 2013-12-02Published Online: 2013-12-10Date issued: 2013

Publication Status: Issued

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Identifiers: DOI: 10.1063/1.4849795

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Title: AIP Advances

Source Genre: Journal

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Pages: - Volume / Issue: 3 (12) Sequence Number: 122112 Start / End Page: - Identifier: DOI: 10.1063/1.4849795