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  Transient states in the breakdown of thin oxide films

Diesing, D., & Hassel, A. W. (2001). Transient states in the breakdown of thin oxide films. Talk presented at Jahrestagung der Deutschen Physikalischen Gesellschaft. Hamburg, Germany. 2001-03-21 - 2001-03-24.

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 Creators:
Diesing, D., Author
Hassel, A. W.1, Author           
Affiliations:
1Electrochemistry and Corrosion, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863355              

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 Identifiers: eDoc: 230064
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Title: Jahrestagung der Deutschen Physikalischen Gesellschaft
Place of Event: Hamburg, Germany
Start-/End Date: 2001-03-21 - 2001-03-24

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