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  A Theoretical Study of Copper Contaminated Dislocations in Silicon

Fujita, N., Jones, R., Öberg, S., Briddon, P. R., & Blumenau, A. T. (2008). A Theoretical Study of Copper Contaminated Dislocations in Silicon. Solid State Phenomena, 131-133, 259-264.

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 Creators:
Fujita, N., Author
Jones, R., Author
Öberg, S., Author
Briddon, P. R., Author
Blumenau, A. T.1, Author           
Affiliations:
1Atomistic Modelling in Interface Science, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863351              

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 Dates: 2008
 Publication Status: Issued
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 Rev. Type: -
 Identifiers: eDoc: 378921
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Title: Solid State Phenomena
Source Genre: Journal
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Pages: - Volume / Issue: 131-133 Sequence Number: - Start / End Page: 259 - 264 Identifier: -