Simultaneous Analysis of Low-Z Impurities in the Near-Surface Region of Solid 
Materials by Heavy Ion Elastic Recoil Detection (HIERD)

Grigull, P.; Behrisch, R.; Kreissig, U.; et al.,

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Simultaneous Analysis of Low-Z Impurities in the Near-Surface Region of Solid Materials by Heavy Ion Elastic Recoil Detection (HIERD)

Grigull, P., Behrisch, R., Kreissig, U., & et al. (1996). Simultaneous Analysis of Low-Z Impurities in the Near-Surface Region of Solid Materials by Heavy Ion Elastic Recoil Detection (HIERD). Fresenius' Journal of Analytical Chemistry, 353, 578-581.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-CFEB-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-CFEC-B

Genre: Journal Article

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Creators:
Grigull, P.¹, Author
Behrisch, R.², Author
Kreissig, U.³, Author
et al.³, Author

Affiliations:
1Experimental Plasma Physics 3 (E3), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856291
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288
3External Organizations, ou_persistent22

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Dates: Date issued: 1996

Publication Status: Issued

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Title: Fresenius' Journal of Analytical Chemistry

Source Genre: Journal

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Pages: - Volume / Issue: 353 Sequence Number: - Start / End Page: 578 - 581 Identifier: -