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  Internal stress measurements by high-energy synchrotron X-ray diffraction at increased specimen-detector distance

Böhm, J., Wanner, A., Kampmann, R., Franz, H., Liss, K.-D., Schreyer, A., et al. (2003). Internal stress measurements by high-energy synchrotron X-ray diffraction at increased specimen-detector distance. Nuclear Instruments and Methods in Physics Research B, 200, 315-322.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2D46-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2D47-C
Genre: Journal Article

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 Creators:
Böhm, J.1, Author           
Wanner, A.1, Author           
Kampmann, R.2, Author
Franz, H.2, Author
Liss, K.-D.2, Author
Schreyer, A.2, Author
Clemens, H.1, Author           
Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
2GKSS-Forschungszentrum Geesthacht GmbH,Institut für Werkstoffforschung, Max-Planck-Straße, 21502 Geesthacht Hamburge Synchrotronstrahlungslabor, Deutsches Elektronen-Sychrotron, Notkestr. 85, 22603 Hamburg, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
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Language(s): eng - English
 Dates: 2003-01
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 205763
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Title: Nuclear Instruments and Methods in Physics Research B
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 200 Sequence Number: - Start / End Page: 315 - 322 Identifier: -