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  Advances in sputter depth profiling using AES

Hofmann, S. (2003). Advances in sputter depth profiling using AES. Surface and Interface Analysis, 35(7), 556-563.

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Genre: Journal Article
Alternative Title : Surf. Interface Anal.

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331.pdf (Abstract), 6KB
 
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 Creators:
Hofmann, S.1, Author              
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer; AES, sputter depth profiling, MRI model, diffusion measurement
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Language(s): eng - English
 Dates: 2003-07
 Publication Status: Published in print
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 Rev. Type: Peer
 Identifiers: eDoc: 112077
ISI: 000184687500002
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Title: Surface and Interface Analysis
  Alternative Title : Surf. Interface Anal.
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 35 (7) Sequence Number: - Start / End Page: 556 - 563 Identifier: ISSN: 0142-2421