Towards SNIM: Scanning Near-field Microscopy in the Infrared

Keilmann, F.

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Towards SNIM: Scanning Near-field Microscopy in the Infrared

Keilmann, F. (1996). Towards SNIM: Scanning Near-field Microscopy in the Infrared. In Garcia, M. Nieto-Vesperinas, & N. (Eds.), Optics at the Nanometer Scale (pp. 235-245). IBM, Netherlands.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-731F-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-7320-C

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Creators:
Keilmann, F.¹, Author

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1External Organizations, ou_persistent22

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Dates: Date issued: 1996

Publication Status: Issued

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Identifiers: eDoc: 318513

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Title: Optics at the Nanometer Scale

Source Genre: Book

Creator(s):
Garcia, Editor
Nieto-Vesperinas, M., Editor
N., Editor

Affiliations:
-

Publ. Info: IBM, Netherlands

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 235 - 245 Identifier: -