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  Three-dimensional diffraction mapping by tuning the X-ray energy

Cornelius, T. W., Carbone, D., Jacques, V. L. R., Schülli, T. U., & Metzger, T. H. (2011). Three-dimensional diffraction mapping by tuning the X-ray energy. Journal of Synchrotron Radiation, 18, 413-417. doi:10.1107/S0909049511003190.

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570004.pdf (Publisher version), 660KB
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 Creators:
Cornelius, T. W., Author
Carbone, D., Author
Jacques, V. L. R., Author
Schülli, T. U., Author
Metzger, T. H.1, Author           
Affiliations:
1Biomaterialien, Max Planck Institute of Colloids and Interfaces, Max Planck Society, ou_1863285              

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Free keywords: Open Access; X-ray diffraction; nanofocused and microfocused XRD; energy scan; three-dimensional reciprocal-space mapping
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Language(s): eng - English
 Dates: 2011
 Publication Status: Issued
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 570004
ISI: 000291401900012
DOI: 10.1107/S0909049511003190
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Title: Journal of Synchrotron Radiation
  Abbreviation : J. Synchrotron Radiat.
Source Genre: Journal
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Publ. Info: Oxford : Blackwell
Pages: Part 3 Volume / Issue: 18 Sequence Number: - Start / End Page: 413 - 417 Identifier: ISSN: 1600-5775
ISSN: 0909-0495