Atom probe tomography of interfaces in ceramic films and oxide scales

Stiller, Krystyna Marta; Thuvander, Mattias; Povstugar, Ivan; Choi, Pyuck-Pa; Andrén, Hans Olof

doi:10.1557/mrs.2015.307

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Atom probe tomography of interfaces in ceramic films and oxide scales

Stiller, K. M., Thuvander, M., Povstugar, I., Choi, P.-P., & Andrén, H. O. (2016). Atom probe tomography of interfaces in ceramic films and oxide scales. MRS Bulletin, 41(1), 35-39. doi:10.1557/mrs.2015.307.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-E3F3-1 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-002A-E3F4-0

Genre: Journal Article

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Creators:
Stiller, Krystyna Marta¹, Author
Thuvander, Mattias², Author
Povstugar, Ivan³, Author
Choi, Pyuck-Pa³, Author
Andrén, Hans Olof¹, Author

Affiliations:
1Department of Applied Physics, Division of Materials Microstructure, Chalmers University of Technology, Sweden, ou_persistent22
2Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384

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Language(s): eng - English

Dates: Date issued: 2016-01-08

Publication Status: Issued

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Identifiers: DOI: 10.1557/mrs.2015.307

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Title: MRS Bulletin

Abbreviation : MRS Bull.

Source Genre: Journal

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Pages: - Volume / Issue: 41 (1) Sequence Number: - Start / End Page: 35 - 39 Identifier: ISSN: 0883-7694
CoNE: https://pure.mpg.de/cone/journals/resource/954925549328