Statistical inference and multiple testing correction in classification-based 
multi-voxel pattern analysis (MVPA): random permutations and cluster size 
control

Stelzer, Johannes; Chen, Yi; Turner, Robert

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Statistical inference and multiple testing correction in classification-based multi-voxel pattern analysis (MVPA): random permutations and cluster size control

Stelzer, J., Chen, Y., & Turner, R. (2011). Statistical inference and multiple testing correction in classification-based multi-voxel pattern analysis (MVPA): random permutations and cluster size control. Poster presented at Society for Neuroscience Annual Meeting, Washington, DC, USA.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-10A7-E Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-002B-BF89-3

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Urheber:
Stelzer, Johannes¹, Autor
Chen, Yi², Autor
Turner, Robert³, Autor

Affiliations:
1Max Planck Research Group Music Cognition and Action, MPI for Human Cognitive and Brain Sciences, Max Planck Society, ou_634555
2Max Planck Fellow Research Group Attention and Awareness, MPI for Human Cognitive and Brain Sciences, Max Planck Society, ou_634553
3Department Neurophysics, MPI for Human Cognitive and Brain Sciences, Max Planck Society, ou_634550