Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk 
Samples

Zaefferer, Stefan

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Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk Samples

Zaefferer, S. (2013). Combined Application of EBSD and ECCI for Crystal Defect Observation in Bulk Samples. Talk presented at GN-MEBA (groupement nationale de microscopie electronique a balayage) 2013. Paris, France. 2013-11-26.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-415B-7 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-415C-5

Genre: Talk

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Creators:
Zaefferer, Stefan¹, Author

Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391

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Language(s): eng - English

Dates: Created: 2013

Publication Status: Not specified

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Title: GN-MEBA (groupement nationale de microscopie electronique a balayage) 2013

Place of Event: Paris, France

Start-/End Date: 2013-11-26

Invited: Yes

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