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  A new large-area mapping technique to improve the statistical reliability of EBSD datasets

Davut, K., & Zaefferer, S. (2011). A new large-area mapping technique to improve the statistical reliability of EBSD datasets. Talk presented at Royal Microscopy Society (RMS) EBSD 2011 Meeting. Düsseldorf, Germany. 2011-03-28 - 2011-03-30.

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 Creators:
Davut, K.1, Author              
Zaefferer, S.1, Author              
Affiliations:
1Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
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 Publication Status: Not specified
 Pages: -
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 Rev. Type: -
 Identifiers: eDoc: 580676
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Title: Royal Microscopy Society (RMS) EBSD 2011 Meeting
Place of Event: Düsseldorf, Germany
Start-/End Date: 2011-03-28 - 2011-03-30

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